Technology & Networking in Silicon Valley & the SF Bay Area: Upcoming Meetings, Courses and Conferences
WEDNESDAY September 8, 2010
SF Bay Area Council, with Region 6 and Oregon Section
Speakers: Saifur Rahman, Virginia Tech; Dmitry Kosterev and Joe Andres, BPA; Rob Pratt, Steve Widergren and Dave McKinnon, PNNL; Jeff Hammarlund and Linda Rankin, Portland State University
Time: 8:00 AM - 5:00 PM
Cost: $99 for IEEE members; $150 for non-members, $25 for full-time students
Place: on the Internet
RSVP: From the flyer
Web: www.e-grid.net/docs/1009-smartgrid.pdf
IEEE Oregon Section Webinar, with the SF Bay Area Council
The Smart Grid: From Appliance to Generator and Back
- September 8, 2010 - 8:00 AM - 5:00 PM
- $99 for IEEE members; $150 for non-members, $25 for full-time students
A systems view of how the Smart Grid provides interactions between the end uses of electricity (”appliances” or industrial processes) and utilities, viewed from the perspective of the technologies, standards, and policies that will enable those interactions and foster innovation and interoperability. For engineers, policy makers, and entrepreneurs who want to understand the Smart Grid in order to make better professional, technical and business decisions.
Talks: - The Challenge of Synchrophasors and Wide Area Control - Smart Grid Communications - Managing Supply and Demand - Smart Grid Cyber Security (and more)
For full information: www.e-grid.net/docs/1009-smartgrid.pdf
THURSDAY September 2, 2010
SCV Technology Management Chapter
Speaker: Kevin Surace, Chairman & CEO, Serious Materials
Time: Networking at 6:00 PM; Forum at 6:30 PM; Dinner at 7:15 PM; Presentation at 7:45 PM
Cost: $10 for IEEE members; $13 for others
Place: RAMADA Silicon Valley, 1217 Wildwood Ave, Sunnyvale
RSVP: not required
Web: www.ieee-scv-tmc.org/
“Thinking Outside the Glass Box” - How an engineer built what Inc Magazine calls a “great company” by doing things differently, and recognizing the power of green.
TUESDAY October 5, 2010
OEB Life Members Group
Speaker/organizer: Charles Herget, Lawrence Livermore National Laboratory (retired)
Time: Networking, buffet dinner, discussion from 6:00 PM - 8:00 PM
Cost: $10 for buffet dinner
Place: Willow Tree Restaurant, 6513 Regional St, Dublin
RSVP: by email by October 1, to rsvp@ieee4life.org
Web: www.ieee4life.org
The first meeting of the Oakland/East Bay Life Member’s Affinity Group will be held on Tuesday, October 5, 2010, at the Willow Tree Restaurant in Dublin. This meeting will be an informal gathering to (more…)
WEDNESDAY September 15, 2010
SCV Power Electronics Chapter
Speaker: Ray Rothrock, VENROCK
Time: Networking & Pizza at 6:30 PM; Presentation at 7:00 PM
Cost: none
Place: National Semiconductor Building E Auditorium, 2900 Semiconductor Drive, Santa Clara
RSVP: not required
Web: www.ewh.ieee.org/r6/scv/pels
The United States is an amazing country, with a long history of innovation when it comes to solving big problems. With the freedom to publish, think, and argue, so many (more…)
THURSDAY September 16, 2010
OEB Industry Applications Chapter
Speakers: Peter Kiggen, Manager, Emerson Control Techniques Solar Plant Solutions; Jim Cushman, Senior Account Manager, Emerson Process Management
Time: No-host social at 5:30 PM; Presentation at 6:15 PM; Dinner at 7:15 PM; Presentation continues at 8:00 PM
Cost: $20 for IEEE members; $25 for non-members
Place: Marie Callender’s Restaurant - The Garden Room; 2090 Diamond Blvd, Concord
RSVP: by September 15, by contacting Gregg Boltz, gboltz@brwncald.com, (925) 210-2571
Web: www.e-grid.net/docs/1009-oeb-ias.pdf
As the demand for Solar Power Generation increases through required regulation, there is a daily evolvement within the PV Solar Plant Development for Utility Scale Applications. Emerson will (more…)
TUESDAY August 24, 2010
SCV Communications Chapter
Time: Networking/refreshments and breakout topics at 6:00 PM; Dinner at 7:30 PM; followed by Karioki
Cost: $35 per person - includes dinner, wine and soft drinks (bring a guest)
Place: China Stix, 2110 El Camino Real, Santa Clara
RSVP: from the website
Web: www.ewh.ieee.org/r6/scv/comsoc
We get started at with networking and mingling till 7:15pm. During our networking session we will have breakout groups to discuss:
– High speed transmission on twisted pair: LANs and xDSL (Sept 8 meeting topic)
– Smart Grid, Smart Devices, Internet of Things (Sept 25 workshop)
– Sprint’s M2M platform and initiatives (Led by Sprint;s M2M product mgr)
– 40G/100G Ethernet (Oct 13 meeting topic)
plus interactive games that will challenge your intellect, and several surprises. There will be a cash bar where you can order the beverage of your choice.
Dinner follows at 7:30 PM, at China Stix restaurant (voted Best Mandarin Chinese Restaurant by readers of Sing Tao Daily Chinese Newspaper and Reader’s Poll-Santa Clara Valley Weekly).
THURSDAY August 19, 2010
SPECTRUM Magazine
Speaker: Irv Badr, Energy & Utilities, IBM Rational
Time: Presentation at 1:00 AM (1 hour)
Cost: none
Place: On the Internet
RSVP: from the website
Web: spectrum.ieee.org/webinar/1642472
WEDNESDAY October 27, 2010
SCV Reliability Chapter
Speaker: Jon G. Elerath, Staff Reliability Engineer, SolFocus
Time: Social/refreshments at 6:30 PM; Presentation at 7:00 PM
Cost: none
Place: Hewlett Packard Oak Room, Bldg 48, 1911 Pruneridge Ave, Cupertino
RSVP: not required
Web: www.ewh.ieee.org/r6/scv/rl
An accelerated reliability test plan was developed for trackers used in high-concentration photo-voltaic power systems. The potential failure modes of the tracker hardware were used to select the hardware that was tested. The 2-parameter (more…)
WEDNESDAY September 29, 2010
SCV Reliability Chapter
Speaker: Mark Spencer, Staff Reliability Engineer, SolFocus
Time: Social/refreshments at 6:30 PM; Presentation at 7:00 PM
Cost: none
Place: Hewlett Packard Oak Room, Bldg 48, 1911 Pruneridge Ave, Cupertino
RSVP: not required
Web: www.ewh.ieee.org/r6/scv/rl
SolFocus is currently involved in two separate accelerated test efforts to quantify the long term life of its SF1100 CPV (concentrator photovoltaic) product. Results from these tests will be correlated with the ongoing monitoring of (more…)
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