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February 3, 2012

IEEE Int’l Reliability Physics Symposium (IRPS)

by @ 6:59 am. Filed under ALL, Electronics Design, Engineering Mgmt, Optics/Displays, Semiconductors
 

IEEE Electron Devices, Reliability Societies
IEEE Int’l Reliability Physics Symposium (IRPS)
– April 15-19, 2012   — Hyatt Regency Anaheim
– Keynote, 24 Tutorials, Exhibits     — Over 180 papers
The premiere conference for engineers and scientists in the area of microelectronics reliability, with participants from US, Europe, Asia. Reliability of semiconductor devices, ICs, and microelectronic assemblies through physics of failure and the application environment.
Two-day tutorial program plus evening workshops.     Topics include: transistor degradation, soft errors, high-k dielectrics, interconnects, 3D/TSV, MEMS, chip/packaging interaction, BEOL, memory and circuit reliability, medical electronics, renewable energy.   Vendor exhibits and equipment demonstrations.
Register before March 18, for best rates. For more information: www.irps.org

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