IEEE S.F. Bay Area Council e-GRID's
BayAreaTech

TUESDAY July 17, 2012
SCV Nanotechnology Chapter
Speaker: Dr. Joy C. Andrews, SLAC National Accelerator Laboratory
Time: Registration & light lunch at 11:30 AM; Presentation at 12:00 Noon
Cost: IEEE Members and Students $5. Non-Members $10
Place: Texas Instruments Bldg E-1 CMA Room, 2900 Semiconductor Drive, Santa Clara
RSVP: from website
Web: www.ieee.org/nano

Correlation of chemistry and morphology in hierarchical functional materials such as battery electrodes, fuel cells and catalysts can drive design of more efficient materials.  Full-field nanoscale chemical imaging has been used to collect single-pixel XANES (~1E6 spectra per energy stack; acquired in minutes) at down to 30 nm resolution.  The full-field transmission X-ray microscope (TXM) on beam line 6-2 at the Stanford Synchrotron Radiation Lightsource combines large field of view (tens to hundreds of microns) with high resolution imaging from ~4.5 to 14 keV (delta-E/E < 1e-4), for XANES chemical speciation.  Custom software (TXM Wizard; available free for public use) is used to produce chemical and morphological maps of various composite systems in 2D and 3D.  In situ and ex situ results from full-field XANES microscopy of Li-ion battery electrodes and other catalytic materials, rendering insight into performance and structure, will be presented.